PID Centre of Excellence

Potential-induced degradation (PID) is a major reliability issue for PV modules in the field; it can cause significant power loss within a few months. SERIS’ PID Centre of Excellence provides various services to manufacturers or academic institutes for PID testing and product optimization:

  • IEC PID testing (IEC 62804):
    • 60°C, 85% RH with -1000 V biasing for 96 hours
    • 25°C with -1000 V biasing and aluminium foil for 7 days
  • IEC + PID testing
    • 85°C, 85% RH with -1000 V biasing for extended hours
    • PID test combined with salt mist test for 112 hours
    • Other customized test conditions
  • Outdoor PID testing in Singapore’s hot, humid and marine environment
  • PV module material optimization to prevent PID

Integrated indoor PID test station

All indoor PID testing at SERIS is performed using an in-house developed integrated PID test station that has the capability to continuously monitor the performance of PV modules under test. The specifications of the system are:

  • 0 - 2000 V bias voltage
  • Leakage current measurement
  • Automatic control system
  • In-situ module characterization with dark I-V measurement
  • Continuous data logging
  • A movable station

Left: Integrated indoor PID test station. Right: Continuous power measurement of two different PV modules subjected to PID.


Outdoor PID testing facility

SERIS’ Outdoor PID testing facility offers real-world testing of PV modules under Singapore’s actual hot and humid climatic conditions. The specifications of the system are:

  • Adjustable 0 - 2000 V bias voltage
  • Continuous leakage current measurement
  • Long-term degradation study
  • In-situ PV module characterization
  • Outdoor imaging (IR, EL & PL)
  • Real-time meteorological data collection

Outdoor PID testing facility


For further information, please contact:

Dr Yong Sheng KHOO
Head of PV Module Development Group
PV Module Cluster
SERIS

yongshengkhoo@nus.edu.sg

+65 6567 8073