PV modules need to be certified for sale in established markets. The PV Module Testing Group (formerly known as PV Performance Analysis Unit) offers the full suite of module testing and analysis according to the standards of the International Electrotechnical Commission (IEC). Silicon wafer based modules and thin-film modules can be tested according to the IEC standards 61215, 61646 and 61730, as well as UL1703.

The unit operates more than 900 m² of laboratory space and 300 m² outdoor test facilities. The laboratories are equipped with the latest technology and proven methodologies to perform conclusive and quantifiable tests and durability and performance. The rooftop test facilities are well-fenced to protect our customers' modules under testing. The entire 300 m² area is equipped with the latest weather monitoring and measurement sensors to study the temperature characteristics of modules under test.

Mounting of a PV module in SERIS' high quality sun simulator

Rooftop testing facilities at PVMT

Services to Industry and Research Organisations

At PV Module Testing we employ “SOLAR STEP” test methods that cover a wide range of reliability and durability testing needs.

These test services include:

• Standard IEC / UL testing

• Other non standard testing

• Light soak stabilisation

• Accelerated aging

• Repeated challenge testing

• Salt mist testing

• Test-to-Fail

• Evaluation of c-Si and thin-film PV technologies

• Potential Induced Degradation (PID)

Standard IEC / UL testing

Together with our in-house certifying partner VDE-ISE Pte Ltd, the PVMT offers various testing and certification laboratory according to the IEC standards 61215, 61646, 61730, UL and CEC requirements.

Other non standard testing

Our latest in-process monitoring of Current Measurements (CM) of modules under test provides periodic insightful information to customer to determine the rate of degradation occurring during climate chamber tests and others such as Mechanical Load test.
Calibration measurements of modules and Series resistance measurements are essential services for our customers.
We also offer Electroluminescence (EL) and Photoluminescence (PL) tests for micro-crack studies of cells within modules.

Light soak stabilisation

Commonly used prior to calibration measurements of modules, this process ensures modules are stabilised against the Staebler–Wronski Effect before embarking on precision measurements or prior to conducting challenge test sequence which may be of long duration

Accelerated aging

To test durability of modules with extended, toughened and controlled test conditions in climate chamber to determine the life expectancy and durability of modules on outdoor weather conditions.

Repeated challenge testing

This is ideal for customers seeking quality PV components; eg. Junction boxes of different vendors.
Another use for such tests entail modules to go through repeated cycles of test sequences.
Such tests are employed to seek out the “best-of-the-best” module in performance challenge testing.

Salt Mist Testing

This test method is popular with both c-Si and thin-film modules and is in compliance with the IEC61701 standard. Testing in the non-metallic chamber allows six different levels of severity, range from short (3 days) to extreme (56 days) of testing, with elaborate holding phase with temperature and RH monitoring.

Test-To-Fail

Modules are subjected to tests until they fail mechanically (visually) and/or electrically.

Evaluation of c-Si and thin-film PV Technologies

Spectral Response measurements on modules for mismatch correction thus ensuring accurate power measurement of modules.

Potential Induced Degradation (PID)

Degradation of modules is often neglected in the PV industry.
With PID, module makers could determine on improving production or even components for best results.

We are pleased to highlight that our test lab is ISO 17025 accredited by the Singapore Accreditation Council (SAC).
“Move to Cleantech Park” Project is planned for 2013 along with two other groups within SERIS.

Staff preparing for module hotspot testing

Salt spray test at PVMT laboratory