Characterisation Services
SERIS operates a well-equipped PV characterisation laboratory. The laboratory is capable of analysing both wafer based and thin-film based PV materials and solar cells. The laboratory focuses on the development of new characterisation techniques, as well as high-precision application of existing characterisation techniques.
SERVICES TO INDUSTRY AND RESEARCH ORGANISATIONS
Sample testing & characterisation
The samples will be characterised by experienced PV experts. The following characterisation techniques are available.
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Advanced solar cell loss analysis where optical, electronic and resistive losses are quantified by means of a series of high-precision measurements |
Full-area spectral response measurement of silicon wafer solar cells up to a size of 210 mm × 210 mm
High-precision illuminated I-V measurements of solar cells using a super-class-A solar simulator with an illuminated area of 210 mm × 210 mm
Electro and photoluminescence imaging of samples with a size up to 210 mm × 210 mm (electroluminescence imaging of samples with a size of up to 2m2)
Quantitative series resistance imaging of silicon wafer solar cells
Dislocation imaging on silicon wafer solar cells
Measurement of thickness and dielectric properties of thin films
Specular and diffuse transmission and reflection measurements
Surface potential and work function mapping
Scanning electron microscopy
Cross-sectional scanning electron microscopy image of pyramid structure obtained by anisotropic etching of a mono-crystalline silicon wafer
New services are added all the time - please enquire if the required service is not listed
Technical Consulting
The PV characterisation laboratory offers consulting services to clients from industry and research organisation. With a combination of high-precision measurements and our extensive knowledge base in the field of PV, we assist:
Research organisation, by providing independent quality control services
Industry, by providing independent quality control services and by improving output and yield
Joint Product Development
The PV characterisation laboratory is constantly developing and/or extending characterisation techniques for applications in the sector of PV. The laboratory teams up with innovative companies to bring these new developments to market.
For further information, please contact:
Dr Bram HOEX
Group Leader, PV Characterisation
SERIS, Silicon Photovoltaics Cluster
Email: bram.hoex@nus.edu.sg